Tehranipoor M. Counterfeit Integrated Circuits : монография / M. Tehranipoor, U. Guin, D. Forte, 2015 r=on-line. - Текст : электронный.
Tehranipoor M. Nanometer technology designs. High-quality delay tests / M. Tehranipoor, N. Ahmed, 2008. - XVII, 281 p. - Текст : непосредственный.
Tehranipoor M. Nanometer technology designs high-quality delay tests / M. Tehranipoor, N. Ahmed, 2008 r=on-line. - Текст : электронный.
Frontiers in electronic testing-FRET / ed. V. Agrawal. Vol. 37 : Emerging nanotechnologies: Test, defect tolerance, and reliability / ed. M. Tehranipoor, 2008. - XII, 405 p. - Текст : непосредственный.
Tehranipoor M. Integrated Circuit Authentication. Hardware Trojans and Counterfeit Detection / M. Tehranipoor, H. Salmani, X. Zhang, 2014 r=on-line. - Текст : электронный.
Emerging nanotechnologies : test, defect tolerance, and reliability / ed. M. Tehranipoor, 2008 r=on-line. - Текст : электронный.