Statistical analyses of variability/reproducibility of environmentally assisted cyclic crack growth rate data utilizing JAERI material performance database(JMPD) / H.Tsuji,N.Yokoyama,H.Nakajima,T.Kondo, 1993. - 42 p. - Текст : непосредственный.
Abe M. Semiconductor heterostructure devices / M.Abe,N.Yokoyama, 1989. - XII,96 p. p. - Текст : непосредственный.
Development of JAERI material performance database(JMPD) and examples of its utilization / H.Tsuji,N.Yokoyama,T.Tsukada,H.Nakajima, 1993. - 24 p. - Текст : непосредственный.