Special sections on magnetism at nanoscale (IUMRS-ICA 2010) and electronic materials (IUMRS-ICEM 2010) / ed. Y. Hou [et al.], 2012. - 861-1716 p. - Текст : непосредственный.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections : монография / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou., 2011 r=on-line (Введено оглавление). - Текст : электронный.