Полное описание
> Semiconductor-On-Insulator Materials for Nanoelectronics Applications : сборник научных трудов / edited by Alexei Nazarov, J.-P. Colinge, Francis Balestra [et al.] ; editor.: A. Nazarov [et al.]. - Berlin ; Heidelberg : Springer Berlin Heidelberg, 2011. - on-line. - (Engineering Materials). - URL: http://dx.doi.org/10.1007/978-3-642-15868-1. - Загл. с экрана. - ISBN 978-3-642-15868-1. - Текст : электронный.
Содержание: >
New semiconductor-on-insulator materials -- Physics of modern SemOI devices -- Diagnostics of the SOI devices -- Sensors and MEMS on SOI.
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47.33 | 621.315.592.9-022.532 | |
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Рубрики:
engineering
semiconductors
nanotechnology
materials science
engineering
nanotechnology and Microengineering
nanotechnology
semiconductors
characterization and Evaluation of Materials
Аннотация: "Semiconductor-On-Insulator Materials for NanoElectonics Applications” is devoted to the fast evolving field of modern nanoelectronics, and more particularly to the physics and technology of nanoelectronic devices built on semiconductor-on-insulator (SemOI) systems. The book contains the achievements in this field from leading companies and universities in Europe, USA, Brazil and Russia. It is articulated around four main topics: 1. New semiconductor-on-insulator materials; 2. Physics of modern SemOI devices; 3. Advanced characterization of SemOI devices; 4. Sensors and MEMS on SOI. "Semiconductor-On-Insulator Materials for NanoElectonics Applications” is useful not only to specialists in nano- and microelectronics but also to students and to the wider audience of readers who are interested in new directions in modern electronics and optoelectronics.
Доп. точки доступа:
Nazarov, A.\editor.\
Colinge, J.\editor.\
Balestra, F.\editor.\
Raskin, J.\editor.\
Gamiz, F.\editor.\
Lysenko, V.\editor.\
http://dx.doi.org/10.1007/978-3-642-15868-1
Держатели документа:
Государственная публичная научно-техническая библиотека России : 123298, г. Москва, ул. 3-я Хорошевская, д. 17 (Шифр в БД-источнике (KATBW): -045155949)>
Шифр в сводном ЭК: 48f8ad44d6d25a4a2af79e5a9467527f
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