• ВХОД

    •  

    Полное описание

    Bhushan, M. Microelectronic Test Structures for CMOS Technology : монография / by Manjul Bhushan, Mark B. Ketchen. - New York, NY : Springer, 2011. - on-line. - URL: http://dx.doi.org/10.1007/978-1-4419-9377-9. - Загл. с экрана. - ISBN 978-1-4419-9377-9. - Текст : электронный.
    Содержание:
    Introduction -- Test Structure Basics -- Resistors -- Capacitors -- MOSFETs -- Ring Oscillators -- High Speed Characterization -- Test Structures of SOI Technology -- Test Equipment and Measurements -- Data Analysis.

    ГРНТИ УДК
    47.33.31621.3.049.771.14-048.24

    Рубрики:
    engineering
    electronics
    microelectronics
    electronic circuits
    optical materials
    electronic materials
    engineering
    electronics and Microelectronics, Instrumentation
    optical and Electronic Materials
    circuits and Systems

    Аннотация: Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements.  Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors’ overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology.
    Доп. точки доступа:
    Ketchen, M.B.

    http://dx.doi.org/10.1007/978-1-4419-9377-9


    Держатели документа:
    Государственная публичная научно-техническая библиотека России : 123298, г. Москва, ул. 3-я Хорошевская, д. 17 (Шифр в БД-источнике (KATBW): -300788807)

    Шифр в сводном ЭК: fcecf5ca0288ec9dd0d525a054543ff7



    Просмотр издания