Полное описание

Scanning Transmission Electron Microscopy : imaging and Analysis / edited by Stephen J. Pennycook, Peter D. Nellist. - Electronic text data. - New York, NY : Springer, 2011. - URL: http://dx.doi.org/10.1007/978-1-4419-7200-2. - Загл. с экрана. - ISBN 978-1-4419-7200-2. - DOI 10.1007/978-1-4419-7200-2. - Текст : электронный.
Содержание:
Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction.

ГРНТИ	УДК
29.35.43	537.533.35

Рубрики:
materials science
microscopy
condensed matter
solid state physics
optical materials
electronic materials
nanotechnology
materials Science
optical and Electronic Materials
characterization and Evaluation of Materials
biological Microscopy
solid State Physics
condensed Matter Physics
nanotechnology

Аннотация: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Доп. точки доступа:
Pennycook, S.\editor.\
Nellist, P.\editor.\

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