Полное описание

Breitenstein, O. Lock-in thermography : basics and use for evaluating electronic devices and materials / O. Breitenstein, W. Warta, M. Langenkamp. - Electronic text data. - Berlin ; Heidelberg : Springer, 2010. - (Springer series in advanced microelectronics, ISSN 1437-0387 ; 10). - URL: http://dx.doi.org/10.1007/978-3-642-02417-7. - ISBN 978-3-642-02417-7.
Рубрики:
Physics
Engineering
Materials
Surfaces (physics)
Physics
Optics, optoelectronics, plasmonics and optical devices
Characterization and evaluation of materials
Engineering, general
Structural materials

Доп. точки доступа:
Warta, W.
Langenkamp, M.
SpringerLink (Online service)

http://dx.doi.org/10.1007/978-3-642-02417-7

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