Полное описание

Distributed Large-Scale Dimensional Metrology : new Insights / by Fiorenzo Franceschini, Maurizio Galetto, Domenico Maisano, Luca Mastrogiacomo, Barbara Pralio. - Electronic text data. - London : Springer, 2011. - URL: http://dx.doi.org/10.1007/978-0-85729-543-9. - Загл. с экрана. - ISBN 978-0-85729-543-9. - DOI 10.1007/978-0-85729-543-9. - Текст : электронный.
Содержание:
1. LSM: The New Paradigm of Distributed Systems -- 2. Indoor GPS (iGPSTM) -- 3. The Mobile Spatial coordinate Measuring System (MScMS) -- 4. Positioning and Coverage of Distributed Devices -- 5. System Calibration -- 6. Self-Diagnostic Tools -- 7. Methodologies for Performance Enhancing -- 8. Evaluation of Measurement Uncertainty.

ГРНТИ	УДК
90.03	006.91

Рубрики:
engineering
computer-aided engineering
mathematical models
physical measurements
measurement
manufacturing industries
machines
tools
engineering
manufacturing, Machines, Tools
measurement Science and Instrumentation
mathematical Modeling and Industrial Mathematics
computer-Aided Engineering (CAD, CAE) and Design

Аннотация: The field of large-scale dimensional metrology (LSM) deals with objects that have linear dimensions ranging from tens to hundreds of meters. It has recently attracted a great deal of interest in many areas of production, including the automotive, railway, and shipbuilding sectors. Distributed Large-Scale Dimensional Metrology introduces a new paradigm in this field that reverses the classical metrological approach: measuring systems that are portable and can be easily moved around the location of the measured object, which is preferable to moving the object itself. Distributed Large-Scale Dimensional Metrology combines the concepts of distributed systems and large-scale metrology at the application level. It focuses on the latest insights and challenges of this new generation of systems from the perspective of the designers and developers. The main topics are: coverage of measuring area, sensors calibration, on-line diagnostics, probe management, and analysis of metrological performance. The general descriptions of each topic are further enriched by specific examples concerning the use of commercially available systems or the development of new prototypes. This will be particularly useful for professional practitioners such as quality engineers, manufacturing and development engineers, and procurement specialists, but Distributed Large-Scale Dimensional Metrology also has a wealth of information for interested academics.
Доп. точки доступа:
Franceschini, F.
Galetto, M.
Maisano, D.
Mastrogiacomo, L.
Pralio, B.

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