Полное описание

Extreme statistics in nanoscale memory design / eds.: A. Singhee, R. A. Rutenbar. - 1. - Electronic text data. - Boston, Ma : Springer Science+Business Media LLC, 2010. - (Integrated circuits and systems, ISSN 1558-9412). - URL: http://dx.doi.org/10.1007/978-1-4419-6606-3. - ISBN 978-1-4419-6606-3.
Рубрики:
Engineering
Electronics
Systems engineering
Engineering
Circuits and systems
Electronics and microelectronics, instrumentation

Доп. точки доступа:
Singhee, A.\ed.\
SpringerLink (Online service)

http://dx.doi.org/10.1007/978-1-4419-6606-3

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