Полное описание

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. - Electronic text data. - London : Springer, 2011. - (Springer Series in Reliability Engineering, ISSN 1614-7839). - URL: http://dx.doi.org/10.1007/978-0-85729-310-7. - Загл. с экрана. - ISBN 978-0-85729-310-7. - DOI 10.1007/978-0-85729-310-7. - Текст : электронный.
Содержание:
1. Introduction -- 2. Development of Physics-based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress Induced Voiding -- 3. Introduction and General Theory of Finite Element Method -- 4. Finite Element Method for Electromigration Study -- 5. Finite Element Method for Stress Induced Voiding -- 6. Finite Element Method for Dielectric Reliability.

ГРНТИ	УДК
47.33.31	621.3.049.771.14-192

Рубрики:
engineering
partial differential equations
computational intelligence
quality control
reliability
industrial safety
electronics
microelectronics
optical materials
electronic materials
engineering
quality Control, Reliability, Safety and Risk
computational Intelligence
electronics and Microelectronics, Instrumentation
optical and Electronic Materials
partial Differential Equations

Аннотация: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics. To help readers cope with the increasing sophistication of FEMs’ applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will: introduce the principle of FEMs; review numerical modeling of ULSI interconnect reliability; describe the physical mechanism of ULSI interconnect reliability encountered in the electronics industry; and discuss in detail the use of FEMs to understand and improve ULSI interconnect reliability from both the physical and practical perspective, incorporating the Monte Carlo method. A full-scale review of the numerical modeling methodology used in the study of interconnect reliability highlights useful and noteworthy techniques that have been developed recently. Many illustrations are used throughout the book to improve the reader’s understanding of the methodology and its verification. Actual experimental results and micrographs on ULSI interconnects are also included. Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections is a good reference for researchers who are working on interconnect reliability modeling, as well as for those who want to know more about FEMs for reliability applications. It gives readers a thorough understanding of the applications of FEM to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
Доп. точки доступа:
Tan, C.M.
Li, W.
Gan, Z.
Hou, Y.

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